Q
how to calculate refractive index of thin film
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Calculating the refractive index of a thin film involves measuring how light bends or refracts when passing through the material. One common method is using the formula derived from Snell's law, n1*sin(θ1) = n2*sin(θ2), where n1 and n2 are the refractive indices of the medium the light is coming from and the thin film, respectively, and θ1 and θ2 are the angles of incidence and refraction. However, for thin films, interference patterns can be used, employing the known wavelengths of light and measuring the angles at which maximum or minimum intensities occur due to constructive or destructive interference. Techniques like ellipsometry can also directly measure the refractive index and thickness of thin films accurately by analyzing the change in polarization as light reflects off the film. Accurate measurement depends on the wavelength of light used, as the refractive index can vary with wavelength.
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